Home / Products / Integrated Circuits (ICs) / Logic - Specialty Logic / SN74BCT8374ADW
Manufacturer Part Number | SN74BCT8374ADW |
---|---|
Future Part Number | FT-SN74BCT8374ADW |
SPQ / MOQ | Contact Us |
Packing Material | Reel/Tray/Tube/Others |
Series | 74BCT |
SN74BCT8374ADW Status (Lifecycle) | In Stock |
Part Status | Active |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |
Country of Origin | USA/JAPAN/MALAYSIA/MEXICO/CN |
SN74BCT8374ADW Weight | Contact Us |
Replacement Part Number | SN74BCT8374ADW-FT |
74LVCZ161284ATTR
STMicroelectronics
74LVX161284AMTD
ON Semiconductor
74LVX161284AMTX
ON Semiconductor
74LVX161284MTD
ON Semiconductor
74SSTV16857PAG
IDT, Integrated Device Technology Inc
74SSTV16857PAG8
IDT, Integrated Device Technology Inc
74SSTVF16857PAG
IDT, Integrated Device Technology Inc
74SSTVF16857PAG8
IDT, Integrated Device Technology Inc
74VHC161284MTD
ON Semiconductor
74VHC161284MTDX
ON Semiconductor
XC3S200-4TQ144I
Xilinx Inc.
LCMXO2-1200HC-4TG144IR1
Lattice Semiconductor Corporation
5SGXEBBR2H43C2N
Intel
EP4S100G5H40I1
Intel
XC4VSX55-11FF1148C
Xilinx Inc.
A40MX04-PL84A
Microsemi Corporation
A42MX09-1PQ100I
Microsemi Corporation
LFE2M100SE-6FN900I
Lattice Semiconductor Corporation
5AGXMB1G4F31I3N
Intel
EP3C80F780C6N
Intel